Fulvio Corno, Paolo Prinetto, Matteo Sonza Reorda. Making the Circular Self-Test Path Technique Effective for Real Circuits. In Proceedings IEEE International Test Conference 1994, TEST: The Next 25 Years, Washington, DC, USA, October 2-6, 1994. pages 949-957, IEEE Computer Society, 1994.
@inproceedings{CornoPR94,
title = {Making the Circular Self-Test Path Technique Effective for Real Circuits},
author = {Fulvio Corno and Paolo Prinetto and Matteo Sonza Reorda},
year = {1994},
tags = {testing},
researchr = {https://researchr.org/publication/CornoPR94},
cites = {0},
citedby = {0},
pages = {949-957},
booktitle = {Proceedings IEEE International Test Conference 1994, TEST: The Next 25 Years, Washington, DC, USA, October 2-6, 1994},
publisher = {IEEE Computer Society},
isbn = {0-7803-2103-0},
}