Testability Analysis and ATPG on Behavioral RT-Level VHDL - researchr publication

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Fulvio Corno, Paolo Prinetto, Matteo Sonza Reorda. Testability Analysis and ATPG on Behavioral RT-Level VHDL. In Proceedings IEEE International Test Conference 1997, Washington, DC, USA, November 3-5, 1997. pages 753-759, IEEE Computer Society, 1997.

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