Fulvio Corno, Paolo Prinetto, Maurizio Rebaudengo, Matteo Sonza Reorda. Partial Scan Flip Flop Selection for Simulation-Based Sequential ATPGs. In Proceedings IEEE International Test Conference 1996, Test and Design Validity, Washington, DC, USA, October 20-25, 1996. pages 558-564, IEEE Computer Society, 1996.
Abstract is missing.