Reducing Test Application Time through Interleaved Scan - researchr publication authors

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Fulvio Corno, Matteo Sonza Reorda, Giovanni Squillero. Reducing Test Application Time through Interleaved Scan. In Proceedings of the 15th Annual Symposium on Integrated Circuits and Systems Design, SBCCI 2002, Porto Alegre, Brazil, September 9-14, 2002. pages 89-94, IEEE Computer Society, 2002. [doi]

This author has not been identified. Look up 'Fulvio Corno' in GoogleThis author has not been identified. Look up 'Matteo Sonza Reorda' in GoogleThis author has not been identified. Look up 'Giovanni Squillero' in Google

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