Fulvio Corno, Matteo Sonza Reorda, Giovanni Squillero. Reducing Test Application Time through Interleaved Scan. In Proceedings of the 15th Annual Symposium on Integrated Circuits and Systems Design, SBCCI 2002, Porto Alegre, Brazil, September 9-14, 2002. pages 89-94, IEEE Computer Society, 2002. [doi]
Abstract is missing.