Fulvio Corno, S. Tosato, P. Gabrielli. System-Level Analysis of Fault Effects in an Automotive Environment. In 18th IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2003), 3-5 November 2003, Boston, MA, USA, Proceedings. pages 529-536, IEEE Computer Society, 2003. [doi]
Abstract is missing.