Multi-Transition Fault Model (MTFM) ATPG patterns towards achieving 0 DPPB on automotive designs

Jorge Corso, Saidapet Ramesh, Kumar Abishek, Ley Teng Tan, Chik Hooi Lew. Multi-Transition Fault Model (MTFM) ATPG patterns towards achieving 0 DPPB on automotive designs. In IEEE International Test Conference, ITC 2021, Anaheim, CA, USA, October 10-15, 2021. pages 278-283, IEEE, 2021. [doi]

Abstract

Abstract is missing.