Analysis of punch-through breakdown in bulk silicon RF power LDMOS transistors - researchr publication authors

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I. Cortés, P. Fernández-Martínez, D. Flores, S. Hidalgo, J. Rebollo. Analysis of punch-through breakdown in bulk silicon RF power LDMOS transistors. Microelectronics Reliability, 48(2):173-180, 2008. [doi]

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