I. Cortés, P. Fernández-Martínez, D. Flores, S. Hidalgo, J. Rebollo. Analysis of punch-through breakdown in bulk silicon RF power LDMOS transistors. Microelectronics Reliability, 48(2):173-180, 2008. [doi]
@article{CortesFFHR08,
title = {Analysis of punch-through breakdown in bulk silicon RF power LDMOS transistors},
author = {I. Cortés and P. Fernández-Martínez and D. Flores and S. Hidalgo and J. Rebollo},
year = {2008},
doi = {10.1016/j.microrel.2007.06.004},
url = {http://dx.doi.org/10.1016/j.microrel.2007.06.004},
tags = {analysis},
researchr = {https://researchr.org/publication/CortesFFHR08},
cites = {0},
citedby = {0},
journal = {Microelectronics Reliability},
volume = {48},
number = {2},
pages = {173-180},
}