Analysis of punch-through breakdown in bulk silicon RF power LDMOS transistors

I. Cortés, P. Fernández-Martínez, D. Flores, S. Hidalgo, J. Rebollo. Analysis of punch-through breakdown in bulk silicon RF power LDMOS transistors. Microelectronics Reliability, 48(2):173-180, 2008. [doi]

Abstract

Abstract is missing.