Jeroen De Coster, Peter De Heyn, Marianna Pantouvaki, Brad Snyder, Hongtao Chen, Erik Jan Marinissen, Philippe Absil, Joris Van Campenhout, Bryan Bolt. Test-station for flexible semi-automatic wafer-level silicon photonics testing. In 21th IEEE European Test Symposium, ETS 2016, Amsterdam, Netherlands, May 23-27, 2016. pages 1-6, IEEE, 2016. [doi]
Abstract is missing.