Reliability of ESD protection devices designed in a 3D technology

Bertrand Courivaud, Nicolas Nolhier, Gilles Ferru, Marise Bafleur, Fabrice Caignet. Reliability of ESD protection devices designed in a 3D technology. Microelectronics Reliability, 54(9-10):2272-2277, 2014. [doi]

Abstract

Abstract is missing.