Experimental and numerical study of the recovery softness and overvoltage dependence on p-i-n diode design

P. Cova, Roberto Menozzi, M. Portesine. Experimental and numerical study of the recovery softness and overvoltage dependence on p-i-n diode design. Microelectronics Journal, 37(5):409-416, 2006. [doi]

Abstract

Abstract is missing.