Automatic generation of test infrastructures for analog integrated circuits by controllability and observability co-optimization - researchr publication authors

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Anthony Coyette, Baris Esen, Wim Dobbelaere, Ronny Vanhooren, Georges G. E. Gielen. Automatic generation of test infrastructures for analog integrated circuits by controllability and observability co-optimization. Integration, 55:393-400, 2016. [doi]

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