Anthony Coyette, Baris Esen, Wim Dobbelaere, Ronny Vanhooren, Georges G. E. Gielen. Automatic generation of test infrastructures for analog integrated circuits by controllability and observability co-optimization. Integration, 55:393-400, 2016. [doi]
@article{CoyetteEDVG16,
title = {Automatic generation of test infrastructures for analog integrated circuits by controllability and observability co-optimization},
author = {Anthony Coyette and Baris Esen and Wim Dobbelaere and Ronny Vanhooren and Georges G. E. Gielen},
year = {2016},
doi = {10.1016/j.vlsi.2016.05.001},
url = {http://dx.doi.org/10.1016/j.vlsi.2016.05.001},
researchr = {https://researchr.org/publication/CoyetteEDVG16},
cites = {0},
citedby = {0},
journal = {Integration},
volume = {55},
pages = {393-400},
}