Anthony Coyette, Baris Esen, Ronny Vanhooren, Wim Dobbelaere, Georges Gielen. Automated testing of mixed-signal integrated circuits by topology modification. In 33rd IEEE VLSI Test Symposium, VTS 2015, Napa, CA, USA, April 27-29, 2015. pages 1-6, IEEE, 2015. [doi]
@inproceedings{CoyetteEVDG15,
title = {Automated testing of mixed-signal integrated circuits by topology modification},
author = {Anthony Coyette and Baris Esen and Ronny Vanhooren and Wim Dobbelaere and Georges Gielen},
year = {2015},
doi = {10.1109/VTS.2015.7116275},
url = {http://dx.doi.org/10.1109/VTS.2015.7116275},
researchr = {https://researchr.org/publication/CoyetteEVDG15},
cites = {0},
citedby = {0},
pages = {1-6},
booktitle = {33rd IEEE VLSI Test Symposium, VTS 2015, Napa, CA, USA, April 27-29, 2015},
publisher = {IEEE},
isbn = {978-1-4799-7597-6},
}