Anthony Coyette, Baris Esen, Ronny Vanhooren, Wim Dobbelaere, Georges Gielen. Automated testing of mixed-signal integrated circuits by topology modification. In 33rd IEEE VLSI Test Symposium, VTS 2015, Napa, CA, USA, April 27-29, 2015. pages 1-6, IEEE, 2015. [doi]
Abstract is missing.