Alexander Coyle, Hui Jiang, Jennifer Dworak, Theodore W. Manikas, Kundan Nepal. Dual Use Circuitry for Early Failure Warning and Test. In 25th International Symposium on Quality Electronic Design, ISQED 2024, San Francisco, CA, USA, April 3-5, 2024. pages 1-8, IEEE, 2024. [doi]
Abstract is missing.