Brian Crafton, Zishen Wan, Samuel Spetalnick, Jong-Hyeok Yoon, Wei Wu, Carlos Tokunaga, Vivek De, Arijit Raychowdhury. Improving compute in-memory ECC reliability with successive correction. In Rob Oshana, editor, DAC '22: 59th ACM/IEEE Design Automation Conference, San Francisco, California, USA, July 10 - 14, 2022. pages 745-750, ACM, 2022. [doi]
@inproceedings{CraftonWSYWTDR22,
title = {Improving compute in-memory ECC reliability with successive correction},
author = {Brian Crafton and Zishen Wan and Samuel Spetalnick and Jong-Hyeok Yoon and Wei Wu and Carlos Tokunaga and Vivek De and Arijit Raychowdhury},
year = {2022},
doi = {10.1145/3489517.3530526},
url = {https://doi.org/10.1145/3489517.3530526},
researchr = {https://researchr.org/publication/CraftonWSYWTDR22},
cites = {0},
citedby = {0},
pages = {745-750},
booktitle = {DAC '22: 59th ACM/IEEE Design Automation Conference, San Francisco, California, USA, July 10 - 14, 2022},
editor = {Rob Oshana},
publisher = {ACM},
isbn = {978-1-4503-9142-9},
}