Pseudo-Exhaustive Adjacency Testing: A BIST Approach for Stuck-Open Faults

Gary L. Craig, Charles R. Kime. Pseudo-Exhaustive Adjacency Testing: A BIST Approach for Stuck-Open Faults. In Proceedings International Test Conference 1985, Philadelphia, PA, USA, November 1985. pages 126-139, IEEE Computer Society, 1985.

Abstract

Abstract is missing.