S. Cremoux, Christophe Fagot, Patrick Girard, Christian Landrault, Serge Pravossoudovitch. A new test pattern generation method for delay fault testing. In 14th IEEE VLSI Test Symposium (VTS 96), April 28 - May 1, 1996, Princeton, NJ, USA. pages 296-301, IEEE Computer Society, 1996. [doi]
@inproceedings{CremouxFGLP96,
title = {A new test pattern generation method for delay fault testing},
author = {S. Cremoux and Christophe Fagot and Patrick Girard and Christian Landrault and Serge Pravossoudovitch},
year = {1996},
url = {http://csdl.computer.org/comp/proceedings/vts/1996/7304/00/73040296abs.htm},
tags = {testing},
researchr = {https://researchr.org/publication/CremouxFGLP96},
cites = {0},
citedby = {0},
pages = {296-301},
booktitle = {14th IEEE VLSI Test Symposium (VTS 96), April 28 - May 1, 1996, Princeton, NJ, USA},
publisher = {IEEE Computer Society},
}