S. Cremoux, Christophe Fagot, Patrick Girard, Christian Landrault, Serge Pravossoudovitch. A new test pattern generation method for delay fault testing. In 14th IEEE VLSI Test Symposium (VTS 96), April 28 - May 1, 1996, Princeton, NJ, USA. pages 296-301, IEEE Computer Society, 1996. [doi]
Abstract is missing.