Kristof Croes, Joke De Messemaeker, Yunlong Li, Wei Guo, Olalla Varela Pedreira, Vladimir Cherman, Michele Stucchi, Ingrid De Wolf, Eric Beyne. Reliability Challenges Related to TSV Integration and 3-D Stacking. IEEE Design & Test of Computers, 33(3):37-45, 2016. [doi]
Abstract is missing.