Creep, hysteresis, and vibration compensation for piezoactuators: atomic force microscopy application

D. Croft, G. Shedd, Santosh Devasia. Creep, hysteresis, and vibration compensation for piezoactuators: atomic force microscopy application. In American Control Conference, ACC 2000, Chicago, Illinois, USA, 28-30 June, 2000. pages 2123-2128, IEEE, 2000. [doi]

@inproceedings{CroftSD00,
  title = {Creep, hysteresis, and vibration compensation for piezoactuators: atomic force microscopy application},
  author = {D. Croft and G. Shedd and Santosh Devasia},
  year = {2000},
  doi = {10.1109/ACC.2000.879576},
  url = {https://doi.org/10.1109/ACC.2000.879576},
  researchr = {https://researchr.org/publication/CroftSD00},
  cites = {0},
  citedby = {0},
  pages = {2123-2128},
  booktitle = {American Control Conference, ACC 2000, Chicago, Illinois, USA, 28-30 June, 2000},
  publisher = {IEEE},
  isbn = {0-7803-5519-9},
}