Future Trends in Test: The Adoption and Use of Low Cost Structural Testers

Alfred L. Crouch. Future Trends in Test: The Adoption and Use of Low Cost Structural Testers. In Proceedings 2004 International Test Conference (ITC 2004), October 26-28, 2004, Charlotte, NC, USA. pages 698-703, IEEE, 2004. [doi]

Bibliographies