Felice Crupi, Massimo Alioto, Jacopo Franco, Paolo Magnone, Ben Kaczer, Guido Groeseneken, Jérôme Mitard, Liesbeth Witters, Thomas Y. Hoffmann. Buried Silicon-Germanium pMOSFETs: Experimental Analysis in VLSI Logic Circuits Under Aggressive Voltage Scaling. IEEE Trans. VLSI Syst., 20(8):1487-1495, 2012. [doi]
@article{CrupiAFMKGMWH12,
title = {Buried Silicon-Germanium pMOSFETs: Experimental Analysis in VLSI Logic Circuits Under Aggressive Voltage Scaling},
author = {Felice Crupi and Massimo Alioto and Jacopo Franco and Paolo Magnone and Ben Kaczer and Guido Groeseneken and Jérôme Mitard and Liesbeth Witters and Thomas Y. Hoffmann},
year = {2012},
doi = {10.1109/TVLSI.2011.2159870},
url = {http://dx.doi.org/10.1109/TVLSI.2011.2159870},
researchr = {https://researchr.org/publication/CrupiAFMKGMWH12},
cites = {0},
citedby = {0},
journal = {IEEE Trans. VLSI Syst.},
volume = {20},
number = {8},
pages = {1487-1495},
}