Tiansong Cui, Bowen Chen, Yanzhi Wang, Shahin Nazarian, Massoud Pedram. Layout Characterization and Power Density Analysis for Shorted-Gate and Independent-Gate 7nm FinFET Standard Cells. In Alex K. Jones, Hai Helen Li, Ayse Kivilcim Coskun, Martin Margala, editors, Proceedings of the 25th edition on Great Lakes Symposium on VLSI, GLVLSI 2015, Pittsburgh, PA, USA, May 20 - 22, 2015. pages 33-38, ACM, 2015. [doi]
Abstract is missing.