A Novel Method to Improve the Test Efficiency of VLSI Tests - researchr publication authors

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Hailong Cui, Sharad C. Seth, Shashank K. Mehta. A Novel Method to Improve the Test Efficiency of VLSI Tests. In Proceedings of the ASPDAC 2002 / VLSI Design 2002, CD-ROM, 7-11 January 2002, Bangalore, India. pages 499-504, IEEE Computer Society, 2002. [doi]

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