Analog Circuit Test Point Selection Incorporating Discretization-Based Fuzzification and Extended Fault Dictionary to Handle Component Tolerances - researchr publication

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Yiqian Cui, Junyou Shi, Zili Wang. Analog Circuit Test Point Selection Incorporating Discretization-Based Fuzzification and Extended Fault Dictionary to Handle Component Tolerances. J. Electronic Testing, 32(6):661-679, 2016. [doi]

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