An improved scan design for minimization of test power under routing constraint - researchr publication authors

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Aijiao Cui, Tingting Yu, Gang Qu, Mengyang Li. An improved scan design for minimization of test power under routing constraint. In 2015 IEEE International Symposium on Circuits and Systems, ISCAS 2015, Lisbon, Portugal, May 24-27, 2015. pages 629-632, IEEE, 2015. [doi]

This author has not been identified. Look up 'Aijiao Cui' in GoogleThis author has not been identified. Look up 'Tingting Yu' in GoogleThis author has not been identified. Look up 'Gang Qu' in GoogleThis author has not been identified. Look up 'Mengyang Li' in Google

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