Aijiao Cui, Tingting Yu, Gang Qu, Mengyang Li. An improved scan design for minimization of test power under routing constraint. In 2015 IEEE International Symposium on Circuits and Systems, ISCAS 2015, Lisbon, Portugal, May 24-27, 2015. pages 629-632, IEEE, 2015. [doi]
@inproceedings{CuiYQL15,
title = {An improved scan design for minimization of test power under routing constraint},
author = {Aijiao Cui and Tingting Yu and Gang Qu and Mengyang Li},
year = {2015},
doi = {10.1109/ISCAS.2015.7168712},
url = {http://dx.doi.org/10.1109/ISCAS.2015.7168712},
researchr = {https://researchr.org/publication/CuiYQL15},
cites = {0},
citedby = {0},
pages = {629-632},
booktitle = {2015 IEEE International Symposium on Circuits and Systems, ISCAS 2015, Lisbon, Portugal, May 24-27, 2015},
publisher = {IEEE},
isbn = {978-1-4799-8391-9},
}