A method for finding the background potential of quantum devices from scanning gate microscopy data using machine learning

Carlo R. da Cunha, Nobuyuki P. Aoki, David K. Ferry, Ying-Cheng Lai. A method for finding the background potential of quantum devices from scanning gate microscopy data using machine learning. Mach. Learn. Sci. Technol., 3(2):25013, 2022. [doi]

Abstract

Abstract is missing.