SAT-Based Test Pattern Generation with Improved Dynamic Compaction - researchr publication authors

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Alexander Czutro, Sudhakar M. Reddy, Ilia Polian, Bernd Becker. SAT-Based Test Pattern Generation with Improved Dynamic Compaction. In 2014 27th International Conference on VLSI Design and 2014 13th International Conference on Embedded Systems, Mumbai, India, January 5-9, 2014. pages 56-61, IEEE, 2014. [doi]

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