Alexander Czutro, Sudhakar M. Reddy, Ilia Polian, Bernd Becker. SAT-Based Test Pattern Generation with Improved Dynamic Compaction. In 2014 27th International Conference on VLSI Design and 2014 13th International Conference on Embedded Systems, Mumbai, India, January 5-9, 2014. pages 56-61, IEEE, 2014. [doi]
@inproceedings{CzutroRPB14,
title = {SAT-Based Test Pattern Generation with Improved Dynamic Compaction},
author = {Alexander Czutro and Sudhakar M. Reddy and Ilia Polian and Bernd Becker},
year = {2014},
doi = {10.1109/VLSID.2014.17},
url = {http://dx.doi.org/10.1109/VLSID.2014.17},
researchr = {https://researchr.org/publication/CzutroRPB14},
cites = {0},
citedby = {0},
pages = {56-61},
booktitle = {2014 27th International Conference on VLSI Design and 2014 13th International Conference on Embedded Systems, Mumbai, India, January 5-9, 2014},
publisher = {IEEE},
}