Alexander Czutro, Matthias Sauer, Tobias Schubert, Ilia Polian, Bernd Becker. SAT-ATPG using preferences for improved detection of complex defect mechanisms. In 30th IEEE VLSI Test Symposium, VTS 2012, Maui, Hawaii, USA, 23-26 April 2012. pages 170-175, IEEE, 2012. [doi]
@inproceedings{CzutroSSPB12,
title = {SAT-ATPG using preferences for improved detection of complex defect mechanisms},
author = {Alexander Czutro and Matthias Sauer and Tobias Schubert and Ilia Polian and Bernd Becker},
year = {2012},
doi = {10.1109/VTS.2012.6231098},
url = {http://dx.doi.org/10.1109/VTS.2012.6231098},
researchr = {https://researchr.org/publication/CzutroSSPB12},
cites = {0},
citedby = {0},
pages = {170-175},
booktitle = {30th IEEE VLSI Test Symposium, VTS 2012, Maui, Hawaii, USA, 23-26 April 2012},
publisher = {IEEE},
isbn = {978-1-4673-1074-1},
}