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Dariusz Czysz, Grzegorz Mrugalski, Nilanjan Mukherjee, Janusz Rajski, P. Szczerbicki, Jerzy Tyszer. Low power compression of incompatible test cubes. In Ron Press, Erik H. Volkerink, editors, 2011 IEEE International Test Conference, ITC 2010, Austin, TX, USA, November 2-4, 2010. pages 704-713, IEEE, 2010. [doi]

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