Low power compression of incompatible test cubes

Dariusz Czysz, Grzegorz Mrugalski, Nilanjan Mukherjee, Janusz Rajski, P. Szczerbicki, Jerzy Tyszer. Low power compression of incompatible test cubes. In Ron Press, Erik H. Volkerink, editors, 2011 IEEE International Test Conference, ITC 2010, Austin, TX, USA, November 2-4, 2010. pages 704-713, IEEE, 2010. [doi]

@inproceedings{CzyszMMRST10,
  title = {Low power compression of incompatible test cubes},
  author = {Dariusz Czysz and Grzegorz Mrugalski and Nilanjan Mukherjee and Janusz Rajski and P. Szczerbicki and Jerzy Tyszer},
  year = {2010},
  doi = {10.1109/TEST.2010.5699274},
  url = {http://dx.doi.org/10.1109/TEST.2010.5699274},
  researchr = {https://researchr.org/publication/CzyszMMRST10},
  cites = {0},
  citedby = {0},
  pages = {704-713},
  booktitle = {2011 IEEE International Test Conference, ITC 2010, Austin, TX, USA, November 2-4, 2010},
  editor = {Ron Press and Erik H. Volkerink},
  publisher = {IEEE},
  isbn = {978-1-4244-7206-2},
}