Deterministic Clustering of Incompatible Test Cubes for Higher Power-Aware EDT Compression - researchr publication authors

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Dariusz Czysz, Grzegorz Mrugalski, Nilanjan Mukherjee, Janusz Rajski, P. Szczerbicki, Jerzy Tyszer. Deterministic Clustering of Incompatible Test Cubes for Higher Power-Aware EDT Compression. IEEE Trans. on CAD of Integrated Circuits and Systems, 30(8):1225-1238, 2011. [doi]

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