Dariusz Czysz, Grzegorz Mrugalski, Nilanjan Mukherjee, Janusz Rajski, P. Szczerbicki, Jerzy Tyszer. Deterministic Clustering of Incompatible Test Cubes for Higher Power-Aware EDT Compression. IEEE Trans. on CAD of Integrated Circuits and Systems, 30(8):1225-1238, 2011. [doi]
Abstract is missing.