Dariusz Czysz, Grzegorz Mrugalski, Janusz Rajski, Jerzy Tyszer. Low Power Embedded Deterministic Test. In 25th IEEE VLSI Test Symposium (VTS 2007), 6-10 May 2007, Berkeley, California, USA. pages 75-83, IEEE Computer Society, 2007. [doi]
Abstract is missing.