Application of particle analysis to transmission electron microscopy (TEM)

John S. DaPonte, Thomas Sadowski, Christine Caragianis-Broadbridge, D. Day, Ann Lehman, D. Krishna, L. Marinella, Paidemwoyo Munhutu, M. Sawicki. Application of particle analysis to transmission electron microscopy (TEM). In Zia-ur Rahman, Stephen E. Reichenbach, Mark A. Neifeld, editors, Visual Information Processing XVI, Orlando, Florida, USA, April 10, 2007. Volume 6575 of SPIE Proceedings, SPIE, 2007. [doi]

Authors

John S. DaPonte

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Thomas Sadowski

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Christine Caragianis-Broadbridge

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D. Day

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Ann Lehman

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D. Krishna

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L. Marinella

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Paidemwoyo Munhutu

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M. Sawicki

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