John S. DaPonte, Thomas Sadowski, Christine Caragianis-Broadbridge, D. Day, Ann Lehman, D. Krishna, L. Marinella, Paidemwoyo Munhutu, M. Sawicki. Application of particle analysis to transmission electron microscopy (TEM). In Zia-ur Rahman, Stephen E. Reichenbach, Mark A. Neifeld, editors, Visual Information Processing XVI, Orlando, Florida, USA, April 10, 2007. Volume 6575 of SPIE Proceedings, SPIE, 2007. [doi]
Abstract is missing.