John S. DaPonte, Thomas Sadowski, Christine Caragianis-Broadbridge, D. Day, Ann Lehman, D. Krishna, L. Marinella, Paidemwoyo Munhutu, M. Sawicki. Application of particle analysis to transmission electron microscopy (TEM). In Zia-ur Rahman, Stephen E. Reichenbach, Mark A. Neifeld, editors, Visual Information Processing XVI, Orlando, Florida, USA, April 10, 2007. Volume 6575 of SPIE Proceedings, SPIE, 2007. [doi]
@inproceedings{DaPonteSCDLKMMS07,
title = {Application of particle analysis to transmission electron microscopy (TEM)},
author = {John S. DaPonte and Thomas Sadowski and Christine Caragianis-Broadbridge and D. Day and Ann Lehman and D. Krishna and L. Marinella and Paidemwoyo Munhutu and M. Sawicki},
year = {2007},
doi = {10.1117/12.714749},
url = {http://dx.doi.org/10.1117/12.714749},
researchr = {https://researchr.org/publication/DaPonteSCDLKMMS07},
cites = {0},
citedby = {0},
booktitle = {Visual Information Processing XVI, Orlando, Florida, USA, April 10, 2007},
editor = {Zia-ur Rahman and Stephen E. Reichenbach and Mark A. Neifeld},
volume = {6575},
series = {SPIE Proceedings},
publisher = {SPIE},
isbn = {978-0-8194-6697-6},
}