A scan-based attack on Elliptic Curve Cryptosystems in presence of industrial Design-for-Testability structures - researchr publication authors

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Jean DaRolt, Amitabh Das, Giorgio Di Natale, Marie-Lise Flottes, Bruno Rouzeyre, Ingrid Verbauwhede. A scan-based attack on Elliptic Curve Cryptosystems in presence of industrial Design-for-Testability structures. In 2012 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2012, Austin, TX, USA, October 3-5, 2012. pages 43-48, IEEE Computer Society, 2012. [doi]

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