Jean DaRolt, Amitabh Das, Giorgio Di Natale, Marie-Lise Flottes, Bruno Rouzeyre, Ingrid Verbauwhede. A scan-based attack on Elliptic Curve Cryptosystems in presence of industrial Design-for-Testability structures. In 2012 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2012, Austin, TX, USA, October 3-5, 2012. pages 43-48, IEEE Computer Society, 2012. [doi]
@inproceedings{DaRoltDNFRV12,
title = {A scan-based attack on Elliptic Curve Cryptosystems in presence of industrial Design-for-Testability structures},
author = {Jean DaRolt and Amitabh Das and Giorgio Di Natale and Marie-Lise Flottes and Bruno Rouzeyre and Ingrid Verbauwhede},
year = {2012},
doi = {10.1109/DFT.2012.6378197},
url = {http://doi.ieeecomputersociety.org/10.1109/DFT.2012.6378197},
researchr = {https://researchr.org/publication/DaRoltDNFRV12},
cites = {0},
citedby = {0},
pages = {43-48},
booktitle = {2012 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2012, Austin, TX, USA, October 3-5, 2012},
publisher = {IEEE Computer Society},
isbn = {978-1-4673-3043-5},
}