Neighborhood Selection for IDDQ Outlier Screening at Wafer Sort

W. Robert Daasch, James McNames, Robert Madge, Kevin Cota. Neighborhood Selection for IDDQ Outlier Screening at Wafer Sort. IEEE Design & Test of Computers, 19(5):74-81, 2002. [doi]

Authors

W. Robert Daasch

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James McNames

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Robert Madge

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Kevin Cota

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