A 40ns Random Access Time Low Voltage 2Mbits EEPROM Memory for Embedded Applications - researchr publication authors

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Jean Michel Daga, Caroline Papaix, Emmanuel Racape, Marylene Combe, Vincent Sialelli, Jeanine Guichaoua. A 40ns Random Access Time Low Voltage 2Mbits EEPROM Memory for Embedded Applications. In 11th IEEE International Workshop on Memory Technology, Design, and Testing (MTDT 2003), 28-29 July 2003, San Jose, CA, USA. pages 81-85, IEEE Computer Society, 2003. [doi]

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