A 40ns Random Access Time Low Voltage 2Mbits EEPROM Memory for Embedded Applications

Jean Michel Daga, Caroline Papaix, Emmanuel Racape, Marylene Combe, Vincent Sialelli, Jeanine Guichaoua. A 40ns Random Access Time Low Voltage 2Mbits EEPROM Memory for Embedded Applications. In 11th IEEE International Workshop on Memory Technology, Design, and Testing (MTDT 2003), 28-29 July 2003, San Jose, CA, USA. pages 81-85, IEEE Computer Society, 2003. [doi]

@inproceedings{DagaPRCSG03,
  title = {A 40ns Random Access Time Low Voltage 2Mbits EEPROM Memory for Embedded Applications},
  author = {Jean Michel Daga and Caroline Papaix and Emmanuel Racape and Marylene Combe and Vincent Sialelli and Jeanine Guichaoua},
  year = {2003},
  url = {http://csdl.computer.org/comp/proceedings/mtdt/2003/2004/00/20040081abs.htm},
  researchr = {https://researchr.org/publication/DagaPRCSG03},
  cites = {0},
  citedby = {0},
  pages = {81-85},
  booktitle = {11th IEEE International Workshop on Memory Technology, Design, and Testing (MTDT 2003), 28-29 July 2003, San Jose, CA, USA},
  publisher = {IEEE Computer Society},
  isbn = {0-7695-2004-9},
}