Xin Dai, Degang Chen, Randall L. Geiger. A cost-effective histogram test-based algorithm for digital calibration of high-precision pipelined ADCs. In International Symposium on Circuits and Systems (ISCAS 2005), 23-26 May 2005, Kobe, Japan. pages 4831-4834, IEEE, 2005. [doi]
Abstract is missing.