Modeling and Experimental Measurement of Active Substrate-Noise Suppression in Mixed-Signal 0.18µm BiCMOS Technology

Haitao Dai, R. W. Knepper. Modeling and Experimental Measurement of Active Substrate-Noise Suppression in Mixed-Signal 0.18µm BiCMOS Technology. IEEE Trans. on CAD of Integrated Circuits and Systems, 28(6):826-836, 2009. [doi]

Abstract

Abstract is missing.